UC Santa Barbara researchers have achieved the first-ever "movie" of electric charges traveling across the interface of two different semiconductor materials. Using scanning ultrafast electron (SUEM) ...
According to [Asianometry], no one believed in the scanning electron microscope. No one, that is, except [Charles Oatley].The video below tells the whole story. The Cambridge graduate built radios ...
The first step for semiconductor chips is visual inspection using an optical microscope or electrical measurements. 2 Mechanical probing, electron beams, emission microscopy, liquid crystal, etc., are ...
The Korea Research Institute of Standards and Science (KRISS, President Lee Ho Seong) has developed an artificial intelligence (AI)-based image segmentation algorithm that can rapidly reconstruct ...
Scanning transmission electron microscopy, or STEM, is a powerful imaging technique that enables researchers to study a material’s morphology, composition, and bonding behavior at the angstrom scale.
New platform for semiconductor inspection and metrology developed through joint research by Photo electron Soul and Nagoya University begins validation at KIOXIA Iwate NAGOYA, Japan — In late ...
A unique laboratory at Michigan Tech captured microscopic photography of snowflakes in a demonstration of the lab's high-powered scanning electron microscope. The Applied Chemical and Morphological ...
STARKVILLE, Miss.—Mississippi State’s Institute for Imaging and Analytical Technologies soon will be home to a scanning electron microscope so advanced that it will be the first of its kind in the ...
From smartphones to autonomous cars to AI supercomputers, nearly every electronic innovation we use today depends on complicated structures at the atomic scale within silicon chips. As these chips ...
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